Nikon Industrial Microscope · MicroCosmos

Nikon ECLIPSE LV150NA LED & LV150N LED

Name: Nikon ECLIPSE LV150NA LED and LV150N LED Industrial Microscope
Brand: Nikon
SKU: ECLIPSE-LV150NA-LV150N-LED
Rating: 4.8 (12 reviews)

Enhanced usability. Improved maintenance.

Modular upright microscopes for episcopic optical contrast techniques, purpose-built for semiconductor substrate and device package inspection, flat panel display (FPD) inspection, electronic components, and innovative materials analysis.

CFI60-2 Optical Series 6 Observation Methods Wafer Loader Integration High CRI LED Illumination

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What is the Nikon ECLIPSE LV150NA LED / LV150N LED?

The ECLIPSE LV150NA LED and LV150N LED are Nikon's modular, upright industrial microscopes built for episcopic optical contrast techniques. With a high colour-rendering LED light source and a shared modular platform, they allow complementary contrast methods — brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence, and two-beam interferometry — on one microscope stand. Both use Nikon's CFI60-2 / CFI60 objective series, support intelligent digital communication with NIS-Elements software, and integrate with Digital Sight cameras. The LV150N LED additionally integrates with Nikon's NWL200 wafer loader for automated semiconductor wafer inspection.

Product Highlights

Various Observation Methods

Brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence and two-beam interferometry are all available with the LV150NA LED and LV150N LED — complementary techniques, one microscope stand.

Complementary Contrast Techniques on One Stand

The modular design of the LV150NA LED and LV150N LED means dedicated episcopic contrast techniques can be swapped in and out as an inspection task demands — from simple brightfield checks of device packaging to darkfield defect detection, polarised light analysis, DIC for surface topology, epi-fluorescence for coated or doped materials, and two-beam interferometry for step-height measurement.

6 Contrast TechniquesModular Platform

Product Highlights

Intelligent Digital Communication

Automatic reporting of objective, illumination and contrast settings keeps inspection records accurate and repeatable.

Objective, Light Intensity, Aperture & Contrast — Detected Automatically

Objective lenses, light intensity, aperture and epi-contrast can all be detected using the LV-ECON controller and NIS-Elements software. The LV150N LED goes a step further, using the LV-NU5IN nosepiece and LV-INAD adapter to automatically detect the mounted objective lens and report it — removing manual logging from the inspection workflow.

LV-ECON ControllerNIS-Elements Integration

Product Highlights

Digital Sight Series

High-definition image capture for documentation, measurement and analysis, built directly into the inspection workflow.

Nikon Digital Sight camera mounted on the ECLIPSE LV150NA LED for high-definition image capture

High-Definition Capture, Measurement & Analysis

Used together with Digital Sight cameras for microscopes, high-definition images can be efficiently captured directly from the LV150NA LED or LV150N LED. Images can then be processed using NIS-Elements software to conduct measurement and analysis, keeping inspection, documentation, and reporting in a single workflow.

Digital Sight CamerasNIS-Elements Analysis

Product Highlights

Wide Range of Accessories

Configure the base microscope stand precisely to the observation method and purpose required.

50% Greater Nosepiece Stopping Accuracy

The latest manual revolving nosepieces achieve stopping accuracy* that is 50% greater than previous models — meaning less field-of-view drift when switching between objectives and back. Other accessories, including microscope stands and LED lamphouses, can be selected to match the observation method and inspection purpose.

*Stopping accuracy: the amount of change in the field of view when rotating the nosepiece to switch objective lenses and then returning to the original objective (e.g. switching from 10X to another magnification and back to 10X).

50% Better Stopping AccuracyConfigurable Stands & Lamphouses

Product Highlights

CFI60-2 Optical Series

Objective lenses designed to match the exact observation required, with colour aberration correction for excellent image quality.

Greatly Reduced Colour Distortion, Excellent Image Quality

Nikon offers a wide selection of objective lenses within the CFI60-2 and CFI60 series, designed to match the specific observation required — brightfield, darkfield, DIC, POL, epi-fluorescence, or interferometry. Colour aberration correction across the series results in greatly reduced colour distortion and consistently excellent image quality for inspection and documentation.

CFI60-2 / CFI60 SeriesColour Aberration Correction

Product Highlights

Integration With Wafer Loader

Automated wafer handling meets high-resolution episcopic inspection for semiconductor production lines.

Nikon ECLIPSE LV150N LED integrated with the NWL200 wafer loader for automated semiconductor wafer inspection

Automated Wafer Inspection With NWL200

Integrating with the NWL200 wafer loader, the LV150N LED can meet wafer inspection needs such as micro-inspections across 6" (150mm) and 8" (200mm) diameter semiconductor wafers, streamlining high-throughput production-line inspection.

NWL200 Compatible6"/8" Wafer Support

Versatile Optics

Compatible Observation Methods

Six episcopic observation techniques are available across the LV150NA LED / LV150N LED platform, depending on the illuminator and accessories fitted.

Brightfield Observation

Standard episcopic illumination for general-purpose inspection of reflective and semi-reflective surfaces such as substrates and packaged devices.

Darkfield Observation

The bright/darkfield switch built into the LV-UEPI-N and LV-UEPI2 illuminators reveals surface defects, scratches and particles against a dark background.

Polarising (POL) Observation

A polarizer/analyzer accepted in the episcopic illuminator enables birefringence and stress analysis on crystalline and anisotropic materials.

Differential Interference Contrast (DIC)

Reveals fine surface topology and step-height variation on semiconductor and material samples with enhanced contrast and depth perception.

Epi-Fluorescence Observation

The LV-UEPI2 illuminator's optional D-LEDI fluorescence LED source, with PC-controllable light adjustment, enables fluorescence inspection of coated or doped materials.

Two-Beam Interferometry

Precision step-height and surface-flatness measurement using interference fringe patterns, suited to semiconductor and MEMS inspection.

Technical Data

Full Specifications

Complete technical specifications for the Nikon ECLIPSE LV150NA LED and LV150N LED, as published on Nikon's official specification page.

Base Unit & Nosepieces
Maximum sample height	38 mm (when used with LV-NU5A nosepiece and LV-S32 3x2 stage / LV-S64 6x4 stage); 73 mm when used with one column riser
Focusing	Coarse and fine adjustment knobs — left: coarse and fine adjustment / right: fine adjustment; 40 mm stroke. Coarse adjustment: 14 mm/turn (with torque adjustment, refocusing mechanism). Fine adjustment: 0.1 mm/turn (1 µm/graduation)
Stage mounting hole intervals	70 × 94 mm (fixed by 4-M4 screw)
Nosepieces	LV150N LEDC-N6, LV-NU5N, LV-NBD5N, LV-NU5IN LV150NA LEDLV-NU5A, LV-NU5AC, LV-NU5AI

Episcopic Illuminators
LV-UEPI-N	High colour-rendering LED lamphouse C-LL-I: 50,000 hours of life*¹. Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable), accepts ⌀25 mm filter (LV-C-LCB, ND4, ND16), polarizer/analyzer; equipped with noise terminator
LV-UEPI2	High colour-rendering LED lamphouse C-LL-I: 50,000 hours of life*¹. Fluorescence LED light source D-LEDI (with light adjustment, PC controllable) — optional. Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable), automated optical element switching matched to brightfield, darkfield and epi-fluorescence switch, accepts ⌀25 mm filter (LV-C-LCB, ND4, ND16), polarizer/analyzer, λ plate, excitation light balancer; equipped with noise terminator

Eyepiece Tubes, Stages & Optics
Eyepiece tubes	LV-TI3 trinocular eyepiece tube ESD (erected image, F.O.V. 22/25) LV-TT2 tilting trinocular eyepiece tube (erected image, F.O.V. 22/25) C-TB binocular tube (inverted image, F.O.V. 22) P-TB binocular tube (inverted image, F.O.V. 22) P-TT2 trinocular tube (inverted image, F.O.V. 22)
Stages	LV-S32 3x2 stage (stroke 75 × 50 mm with glass plate) LV-S64 6x4 stage (stroke 150 × 100 mm with glass plate) LV-S6 6x6 stage (stroke 150 × 150 mm)
Eyepieces	CFI eyepiece series
Objective lenses	CFI60-2 / CFI60 objective lens series — combination depends on observation method

Performance & Electrical
ESD performance	1000 to 10V, within 0.2 sec (excluding certain accessories)
Power consumption	1.2A / 75W
Weight	Approx. 9.0 kg

*1 Estimated value based on Nikon regulations. Stopping accuracy: the amount of change in the field of view when rotating the nosepiece to switch objective lenses and then returning to the original objective. Specifications subject to change without notice.

Optional Accessories & Resources

Configure the LV150NA LED / LV150N LED for Your Inspection Line

Nosepieces, stages, illuminators and integration options tailor the platform to your exact inspection requirement.

LV-ECON Controller

Enables intelligent digital communication of objective, light intensity, aperture and epi-contrast settings with NIS-Elements software.

Digital Sight Cameras

High-definition capture for microscopy, paired with NIS-Elements for measurement and analysis workflows.

NWL200 Wafer Loader Series

Supports comprehensive inspection of 6" and 8" diameter semiconductor wafers by optical microscope or NEXIV video measurement systems.

Microscope Components

Precision components for integrating the LV150NA LED / LV150N LED into manufacturing equipment or inspection systems requiring exceptionally high precision.

Why MicroCosmos Recommends It

LV150NA LED / LV150N LED at a Glance

A quick recap of what sets the Nikon ECLIPSE LV150NA LED and LV150N LED apart for semiconductor, FPD, and materials inspection.

Modular, Multi-Technique Platform

Brightfield, darkfield, POL, DIC, epi-fluorescence and two-beam interferometry — complementary contrast methods on a single microscope stand.

Intelligent Digital Reporting

LV-ECON controller and NIS-Elements automatically detect and log objective, illumination and contrast settings for repeatable inspection records.

CFI60-2 Optical Precision

Colour aberration-corrected objective lenses deliver excellent, distortion-free image quality across every observation method.

50% Better Nosepiece Accuracy

Latest-generation manual revolving nosepieces cut field-of-view drift when switching objectives, versus previous-generation models.

Long-Life, High-CRI LED

50,000-hour rated LED lamphouses deliver consistent, high colour-rendering illumination without frequent bulb changes.

Production-Line Ready

LV150N LED integrates directly with the NWL200 wafer loader for automated 6"/8" semiconductor wafer inspection.

FAQ

Frequently Asked Questions

Common questions about the Nikon ECLIPSE LV150NA LED / LV150N LED industrial microscope, answered directly.

What is the Nikon ECLIPSE LV150NA LED / LV150N LED?

The ECLIPSE LV150NA LED and LV150N LED are Nikon's modular, upright industrial microscopes for episcopic optical contrast techniques. With a high colour-rendering LED light source, they allow complementary contrast methods on a single microscope stand, ideal for semiconductor substrate and device package inspection, flat panel display (FPD) inspection, electronic components, and innovative materials analysis.

What is the difference between the LV150NA LED and LV150N LED?

Both share the same base unit, stages, eyepiece tubes, and CFI60-2/CFI60 objective compatibility. They differ mainly in nosepiece: the LV150N LED uses the C-N6, LV-NU5N, LV-NBD5N or LV-NU5IN nosepieces, while the LV150NA LED uses the LV-NU5A, LV-NU5AC or LV-NU5AI nosepieces. The LV150N LED also integrates with the NWL200 wafer loader for automated wafer inspection.

Which observation methods do the LV150NA LED and LV150N LED support?

Brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence, and two-beam interferometry are all available, depending on the episcopic illuminator and accessories fitted.

What is Intelligent Digital Communication on these microscopes?

Objective lenses, light intensity, aperture and epi-contrast settings can all be detected and reported using the LV-ECON controller together with NIS-Elements software. The LV150N LED additionally uses the LV-NU5IN nosepiece and LV-INAD adapter to detect the mounted objective lens and report it automatically.

What episcopic illuminators are available for the LV150NA LED / LV150N LED?

Two illuminators are available: the LV-UEPI-N, a high colour-rendering LED lamphouse rated for 50,000 hours with a bright/darkfield switch and linked centerable aperture and field diaphragms, and the LV-UEPI2, which adds an optional fluorescence LED light source (D-LEDI) with PC-controllable light adjustment and automated optical element switching matched to brightfield, darkfield, and epi-fluorescence modes.

Can the LV150N LED integrate with a wafer loader?

Yes. The LV150N LED integrates with Nikon's NWL200 wafer loader to meet wafer inspection needs such as micro-inspections on 6 inch (150mm) and 8 inch (200mm) diameter semiconductor wafers.

What objective lenses and stages are compatible with the LV150NA LED / LV150N LED?

Both models use Nikon's CFI60-2 and CFI60 objective lens series with the CFI eyepiece series, chosen to match the observation method required. Available stages include the LV-S32 3x2 stage (75 × 50mm stroke), LV-S64 6x4 stage (150 × 100mm stroke), and LV-S6 6x6 stage (150 × 150mm stroke).

Bring the LV150NA LED / LV150N LED Into Your Facility

MicroCosmos is your authorized source for the Nikon ECLIPSE LV150NA LED / LV150N LED industrial microscope. Talk to our team for pricing, a live demo, or help configuring the right nosepiece, illuminator and stage for your inspection line.

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